Currently Active Peer X-Press Sites
AAA
American Accounting Association
Accounting Horizons
Behavioral Research in Accounting
Current Issues in Auditing
Journal of the American Taxation Association
Journal of Management Accounting Research
Journal of Governmental & Nonprofit Accounting
Issues in Accounting Education
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AAA Section and Regional Conferences
AAA Auditing Section Midyear Meeting
AAA Financial Accounting and Reporting Section Meeting
AAA Information and Strategic Sections Meeting
AAA International Accounting Section Meeting
AAA Midwest Region Meeting
AAA Northeast Region Meeting
AAA Western Region Meeting
AAPM
American Association of Physicists in Medicine
Medical Physics
AIP
American Institute of Physics
Applied Physics Letters
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Biomicrofluidics
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Chaos
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Journal of Applied Physics
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Journal of Chemical Physics
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Journal of Mathematical Physics
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Journal of Physical and Chemical Reference Data
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Journal of Renewable and Sustainable Energy
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Physics of Fluids
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Physics of Plasmas
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MMM Annual Conference Proceedings
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Review of Scientific Instruments
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18th Topical Conference on High-Temperature Plasma Diagnostics
AIP-CP
American Institute of Physics - Conference Proceedings
30th International Conference on the Physics of Semiconductors
ASA
Acoustical Society of America
Journal of the Acoustical Society of America
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Journal of the Acoustical Society of America - Express Letters
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Proceedings of Meetings on Acoustics
ASTM
ASTM International
Geotechnical Testing Journal
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Journal of ASTM International
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Journal of Testing and Evaluation
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ASTM Books
AVS
Science and Technology of Materials, Interfaces, and Processing
JVST A: Journal of Vacuum Science and Technology
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JVST B: Journal of Vacuum Science and Technology
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Biointerphases
ECS
The Electrochemical Society
Electrochemical and Solid-State Letters
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Journal of The Electrochemical Society
EERI
Earthquake Engineering Research Institute
Earthquake Spectra
ICDD
The International Centre for Diffraction Data
Powder Diffraction
NAGT
National Association of Geoscience Teachers
Journal of Geoscience Education
SPIE
Society of Photographic Instrumentation Engineers
Journal of Applied Remote Sensing
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Journal of Biomedical Optics
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Journal of Electronic Imaging
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Journal of Micro/Nanolithography, MEMS, and MOEMS
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Journal of Nanophotonics
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Optical Engineering
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SPIE Reviews
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Journal of Photonics for Energy
SID
Society for Information Display
Journal of the Society for Information Display
SOR
Society of Rheology
Journal of Rheology
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There are no service advisories at this time.
Last Updated: 10:50 AM EDT, Wednesday, August 18, 2010
Service status updates and advisories are posted as needed.
Frequently Asked Questions can be found here.
For assistance with a specific submission or peerx-press site,
please contact pxphelp@aip.org.
With such requests to pxphelp, please be sure to include the name
of the relevant journal or conference site, and any tracking number if available.
Recently Launched Peer X-Press Sites
AVS Science and Technology of Materials, Interfaces, and Processing
August 17, 2010:
JVST A: Journal of Vacuum Science and Technology
JVST B: Journal of Vacuum Science and Technology
Biointerphases
AAA American Accounting Association
June 1, 2010:
Journal of Governmental & Nonprofit Accounting
SPIE Society of Photographic Instrumentation Engineers
May 1, 2010:
Journal of Photonics for Energy
AIP American Institute of Physics Conference Proceedings (AIP-CP)
April 25, 2010:
30th International Conference on the Physics of Semiconductors
AAA American Accounting Association
January 1, 2010:
Behavioral Research in Accounting
Journal of the American Taxation Association
Journal of Management Accounting Research
Issues in Accounting Education
Upcoming Peer X-Press Sites
AAA American Accounting Association
The Accounting Review (TAR)
Auditing: A Journal of Practice & Theory (AJPT)
Journal of Emerging Technologies in Accounting (JETA)
Journal of International Accounting Research (JIAR)
Journal of Information Systems (JIS)
The ATA Journal of Legal Tax Research (JLTR)
Rubber Division American Chemical Society
Rubber Chemistry and Technology
Authorized persons only (Editors, Editorial, and Technical Staff) please log in to access archived documentation:
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